ISO 9001:2015
Modern means of measuring equipment
 

HOMMEL-ETAMIC WAVELINE W15

Production:
JENOPTIK Industrial Metrology Germany (Germany)

HOMMEL-ETAMIC WAVELINE W15 with optional MS300 measuring station
HOMMEL-ETAMIC WAVELINE W15 with optional MS300 measuring station

Portable surface roughness tester HOMMEL-ETAMIC WAVELINE W15

The HOMMEL-ETAMIC WAVELINE W40 system, a new product of 2024, is part of a group of devices for mobile and stationary measurement of roughness, waviness and surface profile.
With the compact Waveline W15 set, you can measure surface roughness flexibly at the desired location. The handy traverse unit lies securely on the workpiece thanks to the integrated support prism and ensures precise measurements.

The extendable tripod legs and a 3-point support on the traverse unit make it easy to adjust to the desired measuring position, both horizontally and vertically. For measurements on low-lying surfaces, in grooves, in incisions or between collars, the probe can also be swiveled by 90° without any retooling. With a wide range of skid probes, the Waveline W15 set is ready for all common roughness measurement tasks. As an option, the system can easily be extended to create a compact measuring station for production or the measuring room.

Measurement and evaluation are carried out using the PC-controlled Evovis Mobile Standard software. The clear presentation of the measurement results, the export of parameters and profiles, optional statistical interfaces and various printout and storage options ensure user-friendly evaluation.

System features:

  • Handy traverse unit for various measuring tasks;
  • Integrated start button for one-handed operation;
  • Optional, compact measuring station, can be used in the measuring room or on the shop foor;
  • Solves all common roughness measurement tasks;
  • Measurement in all positions, even overhead;
  • Various measuring speeds;
  • PC-based evaluation with Evovis Mobile Standard;
  • All current standards including the new ISO 21920 series of standards;
  • Flexible program design and logging;
  • Export of parameters and profiles, optional statistical interfaces;
  • Large range of skid probes.

Additional information

See also: